Matériaux et Phénomènes Quantiques

MPQ

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Université Paris Diderot

UFR de rattachement >

UFR Physique

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UMR

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CNRS

Présentation

The laboratory « Matériaux et Phénomènes Quantiques » (Quantum Materials and Phenomena) is a joint research unit (UMR) of University Paris Diderot and CNRS. It involves about 120 people in total with a permanent staff of 51.

The laboratory specializes in the study of frontier quantum materials and in the development of novel quantum devices. These activities rely on a large spectrum of theoretical and experimental expertise in material physics, transport and optics, and technological platforms of clean-room fabrication, spectroscopy and high-resolution electronic microscopy.

The activities of the laboratory span:

novel materials at the nanoscale: nanocrystals, functionalized nanotubes, multiferroics, 2D materials, etc.
novel phases of matter: quantum fluids of light, ultrastrong coupling in cavity, unconventional superconductivity, strongly correlated systems, topological phases, etc.
nano-optical systems: optomechanics, nonlinear nanophotonics, nanoplasmonics, etc.
quantum engineering and quantum information: quantum optoelectronic devices, quantum photonic circuits, trapped ions, hybrid organic/inorganic devices, surface and interface engineering.

Current projects of the laboratory include the development of novel probes for the investigation of quantum materials, such as time-resolved Raman spectroscopy, optomechanical atomic force microscopy, and scanning tunneling microscopy under optical excitation. Reciprocally, frontier materials are being tested as building blocks to realize novel functionalities in optomechanical sensors, nonlinear and quantum photonics devices, or in cavity embedded transport experiments.

[hal-04277433] Unravelling Kinetic and Thermodynamic Effects on the Growth of Gold Nanoplates by Liquid Transmission Electron Microscopy

Date: 9 Nov 2023 - 14:53

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[hal-02365398] Comprehensive optical losses investigation of VLSI Silicon optomechanical ring resonator sensors

Date: 15 Nov 2019 - 13:35

Desc: [...]

[hal-02362696] A magnetic phase diagram for nanoscale epitaxial BiFeO3 films

Date: 14 Nov 2019 - 08:52

Desc: BiFeO3 thin films have attracted considerable attention by virtue of their potential application in low-energy spintronic and magnonic devices. BiFeO3 possesses an intricate magnetic structure, characterized by a spin cycloid with period ~62 nm that governs the functional magnonic response, and which can be modulated or even destroyed by strain, magnetic and electric fields, or chemical doping. Literature on (110)-oriented BiFeO3 films is not explicit in defining the conditions under which this cycloid persists, as its presence depends on synthesis method and thin film boundary conditions, especially in the sub-100 nm thickness regime. This report aims to end 'trial and error' approaches in determining the conditions under which this cycloid and its associated functional magnonic response exist. We show that in specific crystallographic orientations of epitaxial BiFeO3, an unexplored strain parameter-the distortion in the ab plane of the monoclinic unit cell-significantly influences the spin structure. Combining Mössbauer spectroscopy and low energy Raman spectroscopy with first-principles-based effective Hamiltonian calculations, we show that both average strain and this distortion destroy the cycloid. For films grown on (110) oriented SrTiO3 substrates, if the BiFeO3 lattice parameters a and b differ by more than about 1.2 %, the cycloid is destabilized, resulting in a pseudo-collinear magnetic order ground state. We are thereby able to construct a phase diagram of the spin structure for nanoscale epitaxial BiFeO3 films which aims to resolve long-standing literature inconsistencies and provides powerful guidelines for the design of future magnonic and spintronic devices.

[hal-01908666] [Invited] MEMS-based atomic force microscopy probes: from electromechanical to optomechanical vibrating sensors

Date: 30 Oct 2018 - 13:49

Desc: Scanning probe microscopy has been one of the most important instrumental discoveries during the last quarter of the last century. In particular, atomic force microscopy (AFM) is a cross-disciplinary technique able to provide sample morphology down to the atomic scale. It offers invaluable tools to support the development of nano-sciences, information technologies, micro-nanotechnologies and nano-biology. For more than 20 years, boosting the scan rate of AFM has been an increasingly important challenge of the community. However still today, performing routine and user-friendly AFM experiments at video rate remains unreachable in most cases. The conventional AFM probe based on a micro-sized vibrating cantilever is the major obstacle in terms of bandwidth and resonance frequency.Following a brief description of the context of the work, the talk will first describe the development of AFM probes based on MEMS devices that make use of ring-shaped microresonators vibrating above 10 MHz. A focus will be dedicated to the electrical detection scheme. Based on capacitive transduction and microwave reflectometry, it achieves a displacement resolution of 1E-15 m/√Hz, allowing the measurement of the thermomechanical vibration of the MEMS AFM probes in air. Imaging capability obtained on DNA origamis samples at a frame rate greater than 1 image/s will be shown as well as investigation of block copolymer surfaces to elucidate the tip-surface interaction when vibration amplitudes are lower than 100 pm.In the following, our recent research direction at the convergence of the fields of micro/nanosystems and VLSI optomechanics on silicon chips will be presented. Optomechanical resonators allow indeed overcoming the resolution limitation imposed by usual electromechanical transduction schemes. Here, we will introduce fully optically driven and sensed optomechanical AFM probes which resonance frequency is above 100 MHz and Brownian motion below 1E-16 m/√Hz, paving the way for high-Speed AFM operation with exquisite resolutions at sub-angstrom vibration amplitudes.

[hal-01963015] Comprehensive optical losses investigation of VLSI Silicon optomechanical ring resonator sensors

Date: 21 Dec 2018 - 09:27

Desc: Cavity optomechanics devices are leading edge candidates for a new generation of sensors both in the quantum and classical realms. Several single devices have been demonstrated in numerous labs, however large-scale integration capability necessary for industrial deployment is still an issue. In this paper, we present very-large-scale integrated (VLSI) optomechanical sensors fabricated from standard 200 mm Silicon-On-Insulator (SOI) wafers. Optical properties over a statistically significant sample size have been systematically investigated and show an excellent modeling to experiment agreement, a coupling parameter dispersion of 7% and a manufacturing yield larger than 98%. Controlled versatile sensors, such as these, could easily be embedded in any chip where mass or force sensing is needed.